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Showing results 1 to 18 of 18

Issue DateTitleAuthor(s)TypeView
2020-02A Cost-Effective Structure for Secondary Discharge Control to Improve System-Level ESD Immunity of a Mobile ProductPark, Junsik; Lee, Jongsung; Jo, Cheolgu; Seol, Byongsu; Kim, JingookARTICLE249
2019-09-17A Low-Voltage Microwave Plasma Ionizer without the ESD Risk due to a High Voltage SourceBae, Byoungjin; Park, Junsik; Kim, JingookCONFERENCE53
2018-09-23A proto-type ESD generator for system immunity test of wearable devicesPark, Junsik; Lee, Jongsung; Jo, Cheolgu; Seol, Byoungsu; Kim, JingookCONFERENCE42
2019-07-22An On-die Oscilloscope for System-Level ESD Noise MonitoringLee, Wooryong; Park, Junsik; Kim, Jingook; Ryu, Chunghyun; Lee, Jongsung; Kang, Bonggyu; Bae, BumheeCONFERENCE49
2015-11-24Calculation and Measurement of System-Level ESD CouplingPark, Junsik; Kim, JingookCONFERENCE21
2015-12-15Efficient Calculation of EMI Factors from Power Distribution Network using Cavity Resonance Circuit ModelShin, Dongil; Park, Junsik; Kim, Namsu; Lee, Jongjoo; Park, Youngwoo; Kim, JingookCONFERENCE51
2014-08-03Efficient Calculation of ESD Inductive Coupling on a Conductor Loop Using PEEC MethodKim, Jingook; Park, Junsik; Lee, Jongsung; Seol, ByongsuCONFERENCE48
2015-08Efficient Calculation of Inductive and Capacitive Coupling Due to Electrostatic Discharge (ESD) Using PEEC MethodPark, Junsik; Lee, Jongsung; Seol, Byongsu; Kim, JingookARTICLE790
2017-12-16Electromagnetic Simulations of a Neuromorphic Hardware using PEEC and Memristor SPICE ModelsLee, Wooryong; Park, Junsik; Kim, JingookCONFERENCE45
2017-01Fast and Accurate Calculation of System-Level ESD Noise Coupling to a Signal Trace by PEEC Model DecompositionPark, Junsik; Lee, Jongsung; Seol, Byongsu; Kim, JingookARTICLE650
2015-12-15Fast Calculation of System-Level ESD Noise Coupling to a Microstrip Line Using PEEC MethodPark, Junsik; Lee, Jongsung; Kim, Seongmoo; Seol, Byongsu; Kim, JingookCONFERENCE44
2017-12IC Failure Analysis Due to Charged Board Events by Measurements and Modeling of Discharging Currents Through IC PinsPark, Junsik; Lee, Jongsung; Jo, Cheolgu; Byongsu Seol; Kim, JingookARTICLE560
2019-02Measurement and Analysis of Statistical IC Operation Errors in a Memory Module Due to System-Level ESD NoisePark, Myungjoon; Park, Junsik; Choi, Jongcheul; Kim, Jinwoo; Jeong, Seonghoon; Seung, Manho; Lee, Seokkiu; Kim, JingookARTICLE378
2018-09-23Measurement and analysis of system-level ESD-indauced soft failures of a sense amplifier flip-flop with pseudo differential inputsJeong, Myeongjo; Park, Junsik; Kim, Jinwoo; Seung, Manho; Lee, Seokkiu; Kim, JingookCONFERENCE37
2019-08Measurement and Modeling of Noise Coupling and IC Failure due to System-level ESD EventKim, Jingook; Park, JunsikDoctoral thesis193
2016-05-17Measurement and Modeling of System-level ESD Noise Voltages in Real Mobile ProductsPark, Myungjoon; Park, Junsik; Seung, Manho; Choi, Joungcheul; Lee, Changyeol; Lee, Seokkiu; Kim, JingookCONFERENCE45
2016-09-11Measurement of Discharging Currents through an IC due to the Charged Board Event Using a Shielded Rogowski CoilPark, Junsik; Lee, Jongsung; Kim, Seongmoo; Jo, Cheolgu; Seol, Byongsu; Kim, JingookCONFERENCE46
2017-06-21System-level ESD Noise induced by Secondary Discharges at Voltage Suppressor Devices in a Mobile ProductPark, Junsik; Lee, Jongsung; Jo, Cheolgu; Seol, Byongsu; Kim, JingookCONFERENCE41
Showing results 1 to 18 of 18

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