Scholarworks@UNIST

UNIST Library

Browsing by Author : Park, Junsik

All A B C D E F G H I J K L M N O P Q R S T U V W X Y Z

가 나 다 라 마 바 사 아 자 차 카 타 파 하

Sort by: In order: Results/Page Etal:

Showing results 1 to 20 of 20

A Cost-Effective Structure for Secondary Discharge Control to Improve System-Level ESD Immunity of a Mobile Product File

Park, Junsik , Lee, Jongsung , Jo, Cheolgu , Seol, Byongsu , Kim, Jingook

Article Issue Date2020-02 View80

A Customized Integrated Circuit for Active EMI Filter With High Reliability and Scalability File

Jeong, Sangyeong , Park, Junsik , Kim, Jingook

Article Issue Date2021-11 View203

A Low-Voltage Microwave Plasma Ionizer without the ESD Risk due to a High Voltage Source

Bae, Byoungjin , Park, Junsik , Kim, Jingook

Conference Paper Issue Date2019-09-17 View106

A proto-type ESD generator for system immunity test of wearable devices File

Park, Junsik , Lee, Jongsung , Jo, Cheolgu , Seol, Byoungsu , Kim, Jingook

Conference Paper Issue Date2018-09-23 View98

An On-die Oscilloscope for System-Level ESD Noise Monitoring File

Lee, Wooryong , Park, Junsik , Kim, Jingook , Ryu, Chunghyun , Lee, Jongsung , Kang, Bonggyu , Bae, Bumhee

Conference Paper Issue Date2019-07-22 View96

Calculation and Measurement of System-Level ESD Coupling

Park, Junsik , Kim, Jingook

Conference Paper Issue Date2015-11-24 View69

Efficient Calculation of EMI Factors from Power Distribution Network using Cavity Resonance Circuit Model File

Shin, Dongil , Park, Junsik , Kim, Namsu , Lee, Jongjoo , Park, Youngwoo , Kim, Jingook

Conference Paper Issue Date2015-12-15 View71

Efficient Calculation of ESD Inductive Coupling on a Conductor Loop Using PEEC Method File

Kim, Jingook , Park, Junsik , Lee, Jongsung , Seol, Byongsu

Conference Paper Issue Date2014-08-03 View93

Efficient Calculation of Inductive and Capacitive Coupling Due to Electrostatic Discharge (ESD) Using PEEC Method File

Park, Junsik , Lee, Jongsung , Seol, Byongsu , Kim, Jingook

Article Issue Date2015-08 View251

Electromagnetic Simulations of a Neuromorphic Hardware using PEEC and Memristor SPICE Models File

Lee, Wooryong , Park, Junsik , Kim, Jingook

Conference Paper Issue Date2017-12-16 View63

Fast and Accurate Calculation of System-Level ESD Noise Coupling to a Signal Trace by PEEC Model Decomposition File

Park, Junsik , Lee, Jongsung , Seol, Byongsu , Kim, Jingook

Article Issue Date2017-01 View70

Fast Calculation of System-Level ESD Noise Coupling to a Microstrip Line Using PEEC Method File

Park, Junsik , Lee, Jongsung , Kim, Seongmoo , Seol, Byongsu , Kim, Jingook

Conference Paper Issue Date2015-12-15 View60

Field source extraction of an ESD generator and its application to system-level ESD analysis in a solid-state storage system File

Park, Junsik , Lee, Wooryong , Kim, Namsu , Kang, Bonggyu , Ryu, Chunghyun , Lee, Jongsung , Jo, Cheolgu , Kim, Jingook

Article Issue Date2021-06 View118

IC Failure Analysis Due to Charged Board Events by Measurements and Modeling of Discharging Currents Through IC Pins File

Park, Junsik , Lee, Jongsung , Jo, Cheolgu , Byongsu Seol , Kim, Jingook

Article Issue Date2017-12 View100

Measurement and Analysis of Statistical IC Operation Errors in a Memory Module Due to System-Level ESD Noise File

Park, Myungjoon , Park, Junsik , Choi, Jongcheul , Kim, Jinwoo , Jeong, Seonghoon , Seung, Manho , Lee, Seokkiu , Kim, Jingook

Article Issue Date2019-02 View120

Measurement and analysis of system-level ESD-indauced soft failures of a sense amplifier flip-flop with pseudo differential inputs File

Jeong, Myeongjo , Park, Junsik , Kim, Jinwoo , Seung, Manho , Lee, Seokkiu , Kim, Jingook

Conference Paper Issue Date2018-09-23 View95

Measurement and Modeling of Noise Coupling and IC Failure due to System-level ESD Event File File

Park, Junsik

Thesis Issue Date2019-08 View136

Measurement and Modeling of System-level ESD Noise Voltages in Real Mobile Products File

Park, Myungjoon , Park, Junsik , Seung, Manho , Choi, Joungcheul , Lee, Changyeol , Lee, Seokkiu , Kim, Jingook

Conference Paper Issue Date2016-05-17 View60

Measurement of Discharging Currents through an IC due to the Charged Board Event Using a Shielded Rogowski Coil File

Park, Junsik , Lee, Jongsung , Kim, Seongmoo , Jo, Cheolgu , Seol, Byongsu , Kim, Jingook

Conference Paper Issue Date2016-09-11 View80

System-level ESD Noise induced by Secondary Discharges at Voltage Suppressor Devices in a Mobile Product File

Park, Junsik , Lee, Jongsung , Jo, Cheolgu , Seol, Byongsu , Kim, Jingook

Conference Paper Issue Date2017-06-21 View101

RSS 1.0 RSS 2.0

UNIST | Library

Tel : 052-217-1403 / Email : scholarworks@unist.ac.kr

ScholarWorks@UNIST was established as an OAK Project for the National Library of Korea.