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김진국

Kim, Jingook
Integrated Circuit and Electromagnetic Compatibility Lab.
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Fast Calculation of System-Level ESD Noise Coupling to a Microstrip Line Using PEEC Method

Author(s)
Park, JunsikLee, JongsungKim, SeongmooSeol, ByongsuKim, Jingook
Issued Date
2015-12-15
DOI
10.1109/EDAPS.2015.7383685
URI
https://scholarworks.unist.ac.kr/handle/201301/35447
Fulltext
http://ieeexplore.ieee.org/document/7383685/
Citation
2015 IEEE Electrical Design of Advanced Packaging & Systems Symposium
Abstract
The system-level ESD coupling on a microstrip line is calculated using the partial element equivalent circuit (PEEC) method both in frequency and time domains. A simplified MNA matrix for the victim trace is proposed to quickly calculate the charge and current induced due to the ESD event. The calculated coupling transfer impedance and the ESD waveforms coupled on the traces are validated by comparison with measurements both in frequency and time domains.
Publisher
IEEE

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