File Download
There are no files associated with this item.
SFX Link
- Find it @ UNIST can give you direct access to the published full text of this article. (UNISTARs only)
- Kim, Jingook
- Integrated Circuit and Electromagnetic Compatibility Lab.
Views & Downloads
Detailed Information
Cited time in 
Cited time in 
Cited time in
Metadata Downloads
Measurement of Discharging Currents through an IC due to the Charged Board Event Using a Shielded Rogowski Coil
- Author(s)
- Park, Junsik, Lee, Jongsung, Kim, Seongmoo, Jo, Cheolgu, Seol, Byongsu, Kim, Jingook
- Issued Date
- 2016-09-11
- Citation
- 2016 EOS/ESD Symposium
- Abstract
- The discharging currents through an IC induced by the charged board event (CBE) is measured using a shielded Rogowski coil. Several shielding techniques are applied in the measurement to reduce the common mode noise and the unexpected electric field coupling. The measured results are validated with the CBE circuit simulations.
- Publisher
- 2016 EOS/ESD Symposium
- ISSN
- 0739-5159
Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.