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- Kim, Jingook
- Integrated Circuit and Electromagnetic Compatibility Lab.
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System-level ESD Noise induced by Secondary Discharges at Voltage Suppressor Devices in a Mobile Product
- Author(s)
- Park, Junsik, Lee, Jongsung, Jo, Cheolgu, Seol, Byongsu, Kim, Jingook
- Issued Date
- 2017-06-21
- Citation
- 2017 Asia-Pacific International Symposium on Electromagnetic Compatibility, APEMC 2017, pp.70 - 72
- Abstract
- The system-level ESD noises induced by a secondary discharge at voltage suppressor devices in a mobile product are measured and analyzed. Two kinds of voltage suppressor devices, voltage clamping-type and snapback-type devices, are characterized using TLP measurements. The voltage waveforms at the voltage suppressor devices and the power-ground decoupling capacitors are measured and analyzed according to several kinds of voltage suppressor devices.
- Publisher
- Asia-Pacific International Symposium on Electromagnetic Compatibility
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