File Download
There are no files associated with this item.
SFX Link
- Find it @ UNIST can give you direct access to the published full text of this article. (UNISTARs only)
- Kim, Jingook
- Integrated Circuit and Electromagnetic Compatibility Lab.
Views & Downloads
Detailed Information
Cited time in 
Cited time in 
Cited time in
Metadata Downloads
An On-die Oscilloscope for System-Level ESD Noise Monitoring
- Author(s)
- Lee, Wooryong, Park, Junsik, Kim, Jingook, Ryu, Chunghyun, Lee, Jongsung, Kang, Bonggyu, Bae, Bumhee
- Issued Date
- 2019-07-22
- Citation
- IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, pp.156 - 160
- Abstract
- An on-die oscilloscope circuit is proposed for monitoring of system-level electrostatic discharge (ESD) noises at a power supply or signal line of an integrated circuit (IC). The noise waveform is sampled and converted to digital data in real time. ESD event detector circuits provide a trigger signal for holding the digital data when the ESD event is detected. The digital data are converted back to analog noise waveforms through post-processing. The operations of the proposed on-die oscilloscope circuit are validated in circuit simulations.
- Publisher
- Institute of Electrical and Electronics Engineers
Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.