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- Kim, Jingook
- Integrated Circuit and Electromagnetic Compatibility Lab.
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Measurement and Modeling of System-level ESD Noise Voltages in Real Mobile Products
- Author(s)
- Park, Myungjoon, Park, Junsik, Seung, Manho, Choi, Joungcheul, Lee, Changyeol, Lee, Seokkiu, Kim, Jingook
- Issued Date
- 2016-05-17
- Citation
- 7th Asia-Pacific International Symposium on Electromagnetic Compatibility, APEMC 2016
- Abstract
- Electromagnetic noise source of an integrated circuit (IC) can be approximately modeled with three dipole moments. To improve the previous dipole moments extraction method using 3 TEM cell measurements data, a new dipole moments extraction technique using 24 measurements data in a GTEM cell is proposed herein. The nonlinear least square (NLS) method is applied to accurately extract the three dipole moments including the relative phases of each dipole moment. The near- magnetic field patterns calculated using the improved dipole moments extraction method are compared with those using the previous method.
- Publisher
- APEMC 2016
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