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- Kim, Jingook
- Integrated Circuit and Electromagnetic Compatibility Lab.
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Measurement and analysis of system-level ESD-indauced soft failures of a sense amplifier flip-flop with pseudo differential inputs
- Author(s)
- Jeong, Myeongjo, Park, Junsik, Kim, Jinwoo, Seung, Manho, Lee, Seokkiu, Kim, Jingook
- Issued Date
- 2018-09-23
- Citation
- 40th Annual Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2018
- Abstract
- A sense amplifier flip-flop, which is commonly used as an input receiver in a DRAM, is designed in the simplified motherboard and DIMM structures of a laptop PC. System-level ESD-induced soft failures of the sense amplifier flip-flop are measured and validated with SPICE simulation.
- Publisher
- 40th Annual Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2018
- ISBN
- 1585373028
- ISSN
- 0739-5159
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