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Showing results 1 to 14 of 14

A Cost-Effective Structure for Secondary Discharge Control to Improve System-Level ESD Immunity of a Mobile Product File

Park, Junsik , Lee, Jongsung , Jo, Cheolgu , Seol, Byongsu , Kim, Jingook

Article Issue Date2020-02 View80

A proto-type ESD generator for system immunity test of wearable devices File

Park, Junsik , Lee, Jongsung , Jo, Cheolgu , Seol, Byoungsu , Kim, Jingook

Conference Paper Issue Date2018-09-23 View98

An On-die Oscilloscope for System-Level ESD Noise Monitoring File

Lee, Wooryong , Park, Junsik , Kim, Jingook , Ryu, Chunghyun , Lee, Jongsung , Kang, Bonggyu , Bae, Bumhee

Conference Paper Issue Date2019-07-22 View96

Efficient Calculation of ESD Inductive Coupling on a Conductor Loop Using PEEC Method File

Kim, Jingook , Park, Junsik , Lee, Jongsung , Seol, Byongsu

Conference Paper Issue Date2014-08-03 View93

Efficient Calculation of Inductive and Capacitive Coupling Due to Electrostatic Discharge (ESD) Using PEEC Method File

Park, Junsik , Lee, Jongsung , Seol, Byongsu , Kim, Jingook

Article Issue Date2015-08 View250

Fast and Accurate Calculation of System-Level ESD Noise Coupling to a Signal Trace by PEEC Model Decomposition File

Park, Junsik , Lee, Jongsung , Seol, Byongsu , Kim, Jingook

Article Issue Date2017-01 View69

Fast Calculation of System-Level ESD Noise Coupling to a Microstrip Line Using PEEC Method File

Park, Junsik , Lee, Jongsung , Kim, Seongmoo , Seol, Byongsu , Kim, Jingook

Conference Paper Issue Date2015-12-15 View60

Field source extraction of an ESD generator and its application to system-level ESD analysis in a solid-state storage system File

Park, Junsik , Lee, Wooryong , Kim, Namsu , Kang, Bonggyu , Ryu, Chunghyun , Lee, Jongsung , Jo, Cheolgu , Kim, Jingook

Article Issue Date2021-06 View118

HUSH: Holistic Panoramic 3D Scene Understanding using Spherical Harmonics

Lee, Jongsung , Park, Harin , Lee, Byeong-Uk , Joo, Kyungdon

Conference Paper Issue Date2025-06-12 View17

IC Failure Analysis Due to Charged Board Events by Measurements and Modeling of Discharging Currents Through IC Pins File

Park, Junsik , Lee, Jongsung , Jo, Cheolgu , Byongsu Seol , Kim, Jingook

Article Issue Date2017-12 View100

Measurement of Discharging Currents through an IC due to the Charged Board Event Using a Shielded Rogowski Coil File

Park, Junsik , Lee, Jongsung , Kim, Seongmoo , Jo, Cheolgu , Seol, Byongsu , Kim, Jingook

Conference Paper Issue Date2016-09-11 View80

SlaBins: Fisheye Depth Estimation using Slanted Bins on Road Environments

Lee, Jongsung , Cho, Gyeongsu , Park, Jeongin , Kim, Kyongjun , Lee, Seongoh , Kim, Jung-Hee , Jeong, Seong-Gyun , Joo, Kyungdon

Conference Paper Issue Date2023-10-05 View122

System-level ESD Noise induced by Secondary Discharges at Voltage Suppressor Devices in a Mobile Product File

Park, Junsik , Lee, Jongsung , Jo, Cheolgu , Seol, Byongsu , Kim, Jingook

Conference Paper Issue Date2017-06-21 View101

Trend Analysis ofVegetation Changes of Korean Fir (Abies koreana Wilson) in Hallasan and Jirisan Using MODIS Imagery File File

Choo, Minki , Yo, Cheolhee , Im, Jungho , Cho, Dongjin , Kang, Yoojin , Oh, Hyunkyung , Lee, Jongsung

Article Issue Date2023-06 View137

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