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IC Failure Analysis Due to Charged Board Events by Measurements and Modeling of Discharging Currents Through IC Pins File

Park, Junsik , Lee, Jongsung , Jo, Cheolgu , Byongsu Seol , Kim, Jingook

Article Issue Date2017-12 View19
Measurement and Analysis of Statistical IC Operation Errors in a Memory Module Due to System-Level ESD Noise File

Park, Myungjoon , Park, Junsik , Choi, Jongcheul , Kim, Jinwoo , Jeong, Seonghoon , Seung, Manho , Lee, Seokkiu , Kim, Jingook

Article Issue Date2019-02 View16
Measurement and analysis of system-level ESD-indauced soft failures of a sense amplifier flip-flop with pseudo differential inputs File

Jeong, Myeongjo , Park, Junsik , Kim, Jinwoo , Seung, Manho , Lee, Seokkiu , Kim, Jingook

Conference Paper Issue Date2018-09-23 View25
Measurement and Modeling of Noise Coupling and IC Failure due to System-level ESD Event File

Park, Junsik

Thesis Issue Date2019-08 View15
Measurement and Modeling of System-level ESD Noise Voltages in Real Mobile Products File

Park, Myungjoon , Park, Junsik , Seung, Manho , Choi, Joungcheul , Lee, Changyeol , Lee, Seokkiu , Kim, Jingook

Conference Paper Issue Date2016-05-17 View5
Measurement of Discharging Currents through an IC due to the Charged Board Event Using a Shielded Rogowski Coil File

Park, Junsik , Lee, Jongsung , Kim, Seongmoo , Jo, Cheolgu , Seol, Byongsu , Kim, Jingook

Conference Paper Issue Date2016-09-11 View15
System-level ESD Noise induced by Secondary Discharges at Voltage Suppressor Devices in a Mobile Product File

Park, Junsik , Lee, Jongsung , Jo, Cheolgu , Seol, Byongsu , Kim, Jingook

Conference Paper Issue Date2017-06-21 View16
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