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Park, Heechun
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Active BSCDN Benchmark Framework with Backside-Compatible CNFET Logic Technology

Author(s)
Shin, YehyunKim, IkkyumPark, MinhoYoon, JunghyunBaek, SeunghunEum, SeongminYang, HeesooChoi, YurimJeong, JaeyongKim, SanghyeonJung, HaksoonKim, SeongjuPark, HeechunKwon, Jimin
Issued Date
2025-12-06
DOI
10.1109/IEDM50572.2025.11353496
URI
https://scholarworks.unist.ac.kr/handle/201301/91115
Fulltext
https://ieeexplore.ieee.org/abstract/document/11353496/authors#authors
Citation
IEEE International Electron Devices Meeting
Abstract
This study presents a benchmark framework for digital blocks featuring an active backside clock distribution network (BSCDN), which incorporates clock buffers and sinks implemented using backside-compatible logic based on carbon nanotube field-effect transistors (CNFETs). The proposed framework includes the fabrication, characterization and TCAD modeling of complementary CNFETs, neural network-based compact modeling, standard cell characterization, and a block-level benchmark comparing the performance of the active BSCDN with that of reported passive CDNs.
Publisher
IEEE

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