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Jeong, Jaeyong

정재용

전기전자공학과

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Robust Disturb Immunity in AND-Type 1T FeFET Arrays by Electron Detrapping Mode File

Kim, Bong Ho , Kuk, Song-Hyeon , Hwang, Hyeon-Seong , Jeong, Jaeyong , Park, Youngkeun , Suh, Yoon-Je , Kim, Joon Pyo , Lee, Chan Jik , Cho, Byung Jin , Kim, Sang Hyeon

Article Issue Date2026-04 View14
Advances and Future Challenges in Monolithic 3D Integrated Logic, Power, and Optoelectronics Technologies for Tightly Interconnected Intelligent Systems File

Jung, Haksoon , Choi, Joonghoon , Baek, Seunghun , Shin, Bong Gyu , Song, Young Jae , Jung, Hanggyo , Kim, JoHyeon , Jeon, Jongwook , Kim, Gyumin , Park, Heechun , et al

Article Issue Date2026-03 View29
Effective Recovery Operation in FeFETs via Suppression of Hole Injection File

Kim, Bong Ho , Kuk, Song-Hyeon , Hwang, Hyeon-Seong , Jeong, Jaeyong , Park, Youngkeun , Suh, Yoon-Je , Kim, Joon Pyo , Lee, Chan Jik , Cho, Byung Jin , Kim, Sang Hyeon

Article Issue Date2026-03 View9
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