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Investigation of the Probe-Factor Deconvolution Methods for Dynamic ESD Fields Measurements File

Park, Myungjoon , Choi, Joungcheul , Kim, Jinwoo , Jeong, Seonghoon , Seung, Manho , Lee, Seokkiu , Kim, Jingook

Conference Paper Issue Date2017-06-22 View68
Measurement and Analysis of Statistical IC Operation Errors in a Memory Module Due to System-Level ESD Noise File

Park, Myungjoon , Park, Junsik , Choi, Jongcheul , Kim, Jinwoo , Jeong, Seonghoon , Seung, Manho , Lee, Seokkiu , Kim, Jingook

Article Issue Date2019-02 View123
Measurement and analysis of system-level ESD-indauced soft failures of a sense amplifier flip-flop with pseudo differential inputs File

Jeong, Myeongjo , Park, Junsik , Kim, Jinwoo , Seung, Manho , Lee, Seokkiu , Kim, Jingook

Conference Paper Issue Date2018-09-23 View98
Measurement and Analysis of System-Level ESD-Induced Jitter in a Delay-Locked Loop File

Jeong, Myeongjo , Shin, Minchul , Kim, Jinwoo , Seung, Manho , Lee, Seokkiu , Kim, Jingook

Article Issue Date2020-10 View127
Measurement and Modeling of System-level ESD Noise Voltages in Real Mobile Products File

Park, Myungjoon , Park, Junsik , Seung, Manho , Choi, Joungcheul , Lee, Changyeol , Lee, Seokkiu , Kim, Jingook

Conference Paper Issue Date2016-05-17 View63
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