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- Kim, Jingook
- Integrated Circuit and Electromagnetic Compatibility Lab.
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Investigation of the Probe-Factor Deconvolution Methods for Dynamic ESD Fields Measurements
- Author(s)
- Park, Myungjoon, Choi, Joungcheul, Kim, Jinwoo, Jeong, Seonghoon, Seung, Manho, Lee, Seokkiu, Kim, Jingook
- Issued Date
- 2017-06-22
- Citation
- 2017 Asia-Pacific International Symposium on Electromagnetic Compatibility, APEMC 2017, pp.318 - 320
- Abstract
- Accurate measurements of electromagnetic fields are essential to analyze the radiated noise due to unwanted electrostatic discharge (ESD) events at electronic devices. Usually, to know the radiated noise by ESD events, the voltages induced at field probes are measured, and the fields are obtained from the voltage by de-convolving the probe factor. In this paper, the two probe-factor deconvolution methods are investigated and compared in the measurements of the fields induced by system-level ESD events.
- Publisher
- Institute of Electrical and Electronics Engineers Inc.
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