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Ballistic electron emission microscopy study of p-type 4H-SiC File

Ding, Y , Park, Kibog , Pelz, JP , Los, AV , Mazzola, MS

Article Issue Date2004 View107
Cubic inclusions in 4H-SIC studied with ballistic electron-emission microscopy File

Ding, Y , Park, Kibog , Pelz, JP , Palle, KC , Mikhov, MK , Skromme, BJ

Article Issue Date2004-07 View119
Effect of inclined quantum wells on macroscopic capacitance-voltage response of Schottky contacts: Cubic inclusions in hexagonal SiC File

Park, Kibog , Ding, Y , Pelz, JP , Mikhov, MK , Wang, Y , Skromme, BJ

Article Issue Date2005-05 View104
NTIRE 2019 Challenge on Video Super-Resolution: Methods and Results

Nah, Seungjun , Timofte, Radu , Gu, Shuhang , Baik, Sungyong , Hong, Seokil , Moon, Gyeongsik , Son, Sanghyun , Lee, Kyoung Mu , Wang, Xintao , Chan, Kelvin C.K. , et al

Conference Paper Issue Date2019-06-17 View66
Quantum well state of self-forming 3C-SiC inclusions in 4H SiC determined by ballistic electron emission microscopy File

Ding, Y , Park, Kibog , Pelz, JP , Palle, KC , Mikhov, MK , Skromme, BJ , Meidia, H , Mahajan, S

Article Issue Date2004-01 View123
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