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On Seebeck Coefficients in Nanostrucutred Graphene and Molecules

Jeong, Changwook , Lundstrom, Mark

Conference Paper Issue Date2010-03-15 View2

On the best bandstructure for thermoelectric performance: A Landauer perspective File

Jeong, Changwook , Kim, Raseong , Lundstrom, Mark S.

Article Issue Date2012-06 View5

Optimization of Ring Type Electrode Process for High Density PRAM File

Ryoo, K. C. , Song, Y. J. , Kang, D. H. , Jeong, Changwook , Kong, J. H. , Oh, J. H. , Lim, D. W. , Park, S. S. , .Kim, J. I , Kim, J. H. , et al

Conference Paper Issue Date2006-09-12 View6

PAC-Net: A Model Pruning Approach to Inductive Transfer Learning

Myung, Sanghoon , Huh, In , Jang, Wonik , Choe, Jae Myung , Ryu, Jisu , Kim, Daesin , Kim, Kee-Eung , Jeong, Changwook

Conference Paper Issue Date2022-07-17 View14

Phase-Centric MOCVD Enabled Synthetic Approaches for Wafer-Scale 2D Tin Selenides File File

Kim, Sungyeon , Lee, Wookhee , Ko, Kyungmin , Cho, Hanbin , Cho, Hoyeon , Jeon, Seonhwa , Jeong, Changwook , Kim, Sungkyu , Ding, Feng , Suh, Joonki

Article Issue Date2024-04 View12

Physical understanding of alloy scattering in SiGe channel for high-performance strained pFETs File

Jeong, Changwook , Park, H.-H. , Dhar, S. , Park, S. , Lee, K. , Jin, S. , Choi, W. , Kwon, U.-H. , Lee, K.-H. , Park, Y.

Conference Paper Issue Date2013-12-09 View5

Physics-augmented neural compact model for emerging device technologies File

Kim, Yohan , Myung, Sanghoon , Ryu, Jisu , Jeong, Changwook , Kim, Dae Sin

Conference Paper Issue Date2020-09-23 View6

Plasma-assisted atomic layer growth of high-quality aluminum oxide thin films File

Jeong, Changwook , Lee, JS , Joo, SK

Article Issue Date2001-01 View12

PRAM process technology

Koh, G.H. , Hwang, Y.N. , Lee, S.H. , Lee, S.Y. , Ryoo, K.C. , Park, J.H. , Song, Y.J. , Ahn, S.J. , Jeong, Changwook , Yeung, F. , et al

Conference Paper Issue Date2004-05-17 View2

Prediction and Interpretation of Polymer Properties Using the Graph Convolutional Network File

Park, Jaehong , Shim, Youngseon , Lee, Franklin , Rammohan, Aravind , Goyal, Sushmit , Shim, Munbo , Jeong, Changwook , Kim, Dae Sin

Article Issue Date2022-01 View6

Process technologies for the integration of high density phase change RAM File

Jeong, G. T. , Hwang, Y. N. , Lee, S. H. , Lee, S. Y. , Ryoo, K. C. , Park, J. H. , Song, Y. J. , Ahn, S. J. , Jeong, Changwook , Kim, Y. T. , et al

Conference Paper Issue Date2005-05-09 View5

Programming characteristics of phase change random access memory using phase change simulations File

Kim, Young-Ta , Hwang, Young-Nam , Lee, Keun-Ho , Lee, Se-Ho , Jeong, Changwook , Ahn, Su-Jin , Yeung, Fai , Koh, Gwan-Hyeob , Jeong, Heong-Sik , Chung, Won-Young , et al

Article Issue Date2005-04 View11

Prospects for Nanowire-Doped Polycrystalline Graphene Films for Ultratransparent, Highly Conductive Electrodes File

Jeong, Changwook , Nair, Pradeep , Khan, Mohammad , Lundstrom, Mark , Alam, Muhammad A.

Article Issue Date2011-11 View5

Real-time TCAD: A new paradigm for TCAD in the artificial intelligence era File

Myung, Sanghoon , Kim, Jinwoo , Jeon, Yongwoo , Jang, Wonik , Huh, In , Kim, Jaemin , Han, Songyi , Baek, Kang-Hyun , Ryu, Jisu , Kim, Yoon-Suk , et al

Conference Paper Issue Date2020-09-23 View6

Restructuring TCAD System: Teaching Traditional TCAD New Tricks File

Myung, Sanghoon , Jang, Wonik , Jin, Seonghoon , Choe, Jae Myung , Jeong, Changwook , Kim, Dae Sin

Conference Paper Issue Date2021-12-11 View10

Ring contact electrode process for high density phase change random access memory File

Ryoo, Kyung-Chang , Song, Yoon Jong , Shin, Jae-Min , Park, Sang-Su , Lim, Dong-Won , Kim, Jae-Hyun , Park, Woon-Ik , Sim, Ku-Ri , Jeong, Ji-Hyun , Kang, Dae-Hwan , et al

Article Issue Date2007-04 View8

Si FinFET based 10nm technology with multi Vt gate stack for low power and high performance applications File

Cho, H.-J. , Oh, H.S. , Nam, K.J. , Kim, Y.H. , Yeo, K.H. , Kim, W.D. , Chung, Y.S. , Nam, Y.S. , Kim, S.M. , Kwon, W.H. , et al

Conference Paper Issue Date2016-06-13 View7

Simulator acceleration and inverse design of fin field-effect transistors using machine learning File

Kim, Insoo , Park, So Jeong , Jeong, Changwook , Shim, Munbo , Kim, Dae Sin , Kim, Gyu-Tae , Seok, Junhee

Article Issue Date2022-01 View5

Switching current scaling and reliability evaluation in PRAM

Jeong, Changwook

Conference Paper Issue Date2004-08-22 View1

The Impact of Dislocation on Bulk -Si FinFET Technologies: Physical Modeling of Strain Relaxation and Enhancement by Dislocation File

Min, Jeong Guk , Jeong, Changwook , Kwon, Uihui , Kim, Dae Sin , Kim, Suhyun , Kim, Ilryoung , Yang, Joon-Sung

Conference Paper Issue Date2018-10-14 View11

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