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Choi, Kyoung Jin
Energy Conversion Materials Lab.
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Structural Characteristics of Ternary InxGa1-xAs Nanowires on Si (111) Grown via Au-Catalyzed VLS

Author(s)
Shin, Jae CheolKim, Do YangPark, Jae HyungOh, Si DuckKo, Hang JuHan, Myung SooKim, Jae HunChoi, Kyoung JinKim, Hyo Jin
Issued Date
2013-05
DOI
10.1166/jnn.2013.7301
URI
https://scholarworks.unist.ac.kr/handle/201301/3474
Fulltext
http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=84876950111
Citation
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.13, no.5, pp.3511 - 3514
Abstract
We have characterized the structural properties of the ternary In xGa1-xAs nanowires (NWs) grown on silicon (Si) substrates using metalorganic chemical vapor deposition (MOCVD). Au catalyzed vapor-liquid-solid (VLS) mode was used for the NW growth. The density of the InxGa1-xAs NW array grown under optimized condition exceeds 1 × 108/cm2. X-ray diffraction (XRD) spectra confirm the In composition (x = 0.9-0.3) of the InxGa 1-xAs nanowires which bandgap energy can cover the entire near-infrared (NIR) range. Massive stacking faults and twin planes were observed but no misfit dislocation was found along the NWs as confirmed by transmission electron microscopy (TEM). The energy-dispersive X-ray spectroscopy (EDS) analysis shows the gradual variation of In composition along the NW.
Publisher
AMER SCIENTIFIC PUBLISHERS
ISSN
1533-4880
Keyword (Author)
InxGa1-xAsNanowiresVapor-Liquid-SolidMOCVD
Keyword
ARRAYS

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