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Yoon, Heein
Advanced Circuits and Electronics Lab.
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A Low-Jitter Injection-Locked Multi-Frequency Generator Using Digitally Controlled Oscillators and Time-Interleaved Calibration

Yoon, HeeinPark, SuneuiChoi, Jaehyouk
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IEEE JOURNAL OF SOLID-STATE CIRCUITS, v.54, no.6, pp.1564 - 1574
This paper presents a low-jitter, injection-locked frequency generator that can provide multiple output frequencies concurrently. The injection-locked digitally controlled oscillators (DCOs) can be controlled separately so that their output frequencies can be changed independently between 0.9 and 1.2 GHz in 15-MHz steps. Due to the proposed time-interleaved frequency calibrator that operates continuously in the background, all injection-locked DCOs are ensured to maintain excellent jitter performance against process, voltage, and temperature (PVT) variations. As a prototype, the proposed injection-locked, multi-frequency generator (ILMFG) was designed to generate two independently controlled output signals, and it was fabricated in a 65-nm CMOS technology. The 1-MHz phase noise and the rms jitter integrated from 1 kHz to 40 MHz of the 960-MHz output signal were -133.5 dBc/Hz and 375 fs, respectively. The degradation of rms jitter was restricted to less than 10%. The silicon area was 0.05 mm(2), and the total power consumption was 7.7 mW when generating two different output frequencies.
Institute of Electrical and Electronics Engineers Inc.
Keyword (Author)
Clock multiplierdigitally controlled oscillator (DCO)fractional resolutionfrequency synthesizerinjection lockingjittermulti-frequency generatorphase noisereplicatime-interleaved
Frequency synthesizersPhase noiseClock multipliersDigitally controlled oscillatorsInjection-lockingMulti frequencyreplicaTime-interleavedJitter


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