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A Cost-Effective Structure for Secondary Discharge Control to Improve System-Level ESD Immunity of a Mobile Product File

Park, Junsik , Lee, Jongsung , Jo, Cheolgu , Seol, Byongsu , Kim, Jingook

Article Issue Date2020-02 View80
A proto-type ESD generator for system immunity test of wearable devices File

Park, Junsik , Lee, Jongsung , Jo, Cheolgu , Seol, Byoungsu , Kim, Jingook

Conference Paper Issue Date2018-09-23 View98
Field source extraction of an ESD generator and its application to system-level ESD analysis in a solid-state storage system File

Park, Junsik , Lee, Wooryong , Kim, Namsu , Kang, Bonggyu , Ryu, Chunghyun , Lee, Jongsung , Jo, Cheolgu , Kim, Jingook

Article Issue Date2021-06 View118
IC Failure Analysis Due to Charged Board Events by Measurements and Modeling of Discharging Currents Through IC Pins File

Park, Junsik , Lee, Jongsung , Jo, Cheolgu , Byongsu Seol , Kim, Jingook

Article Issue Date2017-12 View100
Measurement of Discharging Currents through an IC due to the Charged Board Event Using a Shielded Rogowski Coil File

Park, Junsik , Lee, Jongsung , Kim, Seongmoo , Jo, Cheolgu , Seol, Byongsu , Kim, Jingook

Conference Paper Issue Date2016-09-11 View80
System-level ESD Noise induced by Secondary Discharges at Voltage Suppressor Devices in a Mobile Product File

Park, Junsik , Lee, Jongsung , Jo, Cheolgu , Seol, Byongsu , Kim, Jingook

Conference Paper Issue Date2017-06-21 View101
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