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Showing results 2 to 21 of 103

A Digital Signal-based Method for Real-time Diagnosis of Wire Health

이진우 , 권대일

Conference Paper Issue Date2017-05-12 View8
A Digital Signal-based Prognostic Approach to Factory Automation

Lee, Jinwoo , Kwon, Daeil

Conference Paper Issue Date2017-07-12 View6
A DIGITAL TECHNIQUE FOR DIAGNOSING INTERCONNECT DEGRADATION BY USING DIGITAL SIGNAL CHARACTERISTICS File

Lee, Jinwoo , Kwon, Daeil

Article Issue Date2017-02 View11
A dimensional compensation algorithm for vertical bending deformation of 3D printed parts in selective laser sintering File

Ha, Sangho , Ransikarbum, Kasin , Han, Hweeyoung , Kwon, Daeil , Kim, Hyeonnam , Kim, Namhun

Article Issue Date2018-08 View17
A Framework for Prognostics and Health Management Applications toward Smart Manufacturing Systems File

Shin, Insun , Lee, Junmin , Lee, Jun Young , Jung, Kyusung , Kwon, Daeil , Youn, Byeng D. , Jang, Hyun Soo , Choi, Joo-Ho

Article Issue Date2018-08 View19
A model-based prognostic approach to predict interconnect failure using impedance analysis File

Kwon, Daeil , Yoon, Jeongah

Article Issue Date2016-10 View8
A Model-based Prognostic Approach to Predict Remaining Useful Life of Inter-connects using Impedance Analysis

Kwon, Daeil , Yoon, Jeongah

Conference Paper Issue Date2015-11-24 View4
A Prognostic Method of Assessing Solder Joint Reliability Based on Digital Signal Characterization File

Yoon, Jeongah , Shin, Insun , Park, Juyoung , Kwon, Daeil

Conference Paper Issue Date2015-05-26 View15
A SENSORLESS APPROACH OF INTERCONNECT FAILURE DETECTION FOR PROGNOSTICS OF ELECTRONICS

Lee, Jinwoo , Kwon, Daeil

Conference Paper Issue Date2016-08-26 View6
A similarity based prognostics approach for real time health management of electronics using impedance analysis and SVM regression File

Lee, Changyong , Kwon, Daeil

Article Issue Date2018-04 View8
Accelerated Degradation Model for C-rate Loading of Lithium-ion Batteries File

Saxena, Saurabh , Kwon, Daeil , Pecht, Michael , Xing, Yinjiao

Article Issue Date2019-05 View19
Accelerated Life Test of Optoelectronic Devices and Lifetime Prediction based on Bayesian Approaches

신인선 , 권대일

Conference Paper Issue Date2017-05-12 View7
Accelerated Stress Testing Methodology to Risk Assess Silicon-Package Thermo-Mechanical Failure Modes Resulting from Moisture Exposure under Use Conditions File

Rangaraj, Sudarshan , Kwon, Daeil , Pei, Min , Hicks, Jeffrey , Leatherman, G , Lucero, Alan , Wilson, Terri , Streit, Sarah , He, Jun

Conference Paper Issue Date2013-04-14 View6
Adaptive SVM-based Real-time Quality Assessment for Primer-Sealer Dispensing Process of Sunroof Assembly Line File

Oh, YeongGwang , Ransikarbum, Kasin , Busogi, Moise , Kwon, Daeil , Kim, Namhun

Conference Paper Issue Date2017-07-12 View17
Adaptive SVM-based Real-time Quality Assessment for Primer-Sealer Dispensing Process of Sunroof Assembly Line File

Oh, YeongGwang , Ransikarbum, Kasin , Busogi, Moise , Kwon, Daeil , Kim, Namhun

Article Issue Date2019-04 View9
Advances and Challenges in PHM Based Risk Assessment of Electronics Systems

Kwon, Daeil

Conference Paper Issue Date2014-08-25 View8
Advances and Challenges in Prognostics and Health Management: Need for Interdisciplinary Teaching and Learning

Kwon, Daeil

Conference Paper Issue Date2017-01-03 View5
An Analysis of Quality Monitoring and Control System using Real-Time, Integrated Cost Effectiveness and Support Vector Machine

Oh, YeongGwang , Ransikarbum, Kasin , Busogi, Moise , Kwon, Daeil , Kim, Namhun

Conference Paper Issue Date2017-07-12 View21
An Approach to Monitor Interconnect Degradation for Prognostics of Electronics Based on Digital Signal Characterization

Yoon, Jeongah , Kwon, Daeil

Conference Paper Issue Date2016-07-26 View11
Comparative Analysis of Interconnect Degradation using RF Impedance and Event Detectors

Kwon, Daeil , None

Conference Paper Issue Date2010-04-06 View18
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