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A SENSORLESS APPROACH OF INTERCONNECT FAILURE DETECTION FOR PROGNOSTICS OF ELECTRONICS

Author(s)
Lee, Jinwoo, Kwon, Daeil
Issued Date
2016-08-26
URI
https://scholarworks.unist.ac.kr/handle/201301/40980
Citation
7th Asia-Pacific International Symposium on Advanced Reliability and Maintenance Modeling
Publisher
Asia-Pacific International Symposium on Advanced Reliability and Maintenance Modeling

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