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Accelerated Life Test of Optoelectronic Devices and Lifetime Prediction based on Bayesian Approaches

Author(s)
신인선권대일
Issued Date
2017-05-12
URI
https://scholarworks.unist.ac.kr/handle/201301/39157
Citation
2017 대한기계학회 울산지회 춘계학술대회
Publisher
대한기계학회

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