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Kim, Jingook
Integrated Circuit and Electromagnetic Compatibility Laboratory (IC & EMC Lab)
Research Interests
  • Convergence between circuit and EM domains

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Closed-Form Expressions for the Noise Voltage Caused by a Burst Train of IC Switching Currents on a Power Distribution Network

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Title
Closed-Form Expressions for the Noise Voltage Caused by a Burst Train of IC Switching Currents on a Power Distribution Network
Author
Kim, JingookLee, JongjooAhn, SeungyoungFan, Jun
Issue Date
2014-12
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Citation
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, v.56, no.6, pp.1585 - 1597
Abstract
A burst stimulus of data is a common activity in circuits and systems. The supply noise voltage waveform induced by a burst train of integrated circuit (IC) switching currents is rigorously derived for a power distribution network (PDN) with power traces, commonly used in handheld devices. Closed-form expressions are proposed to quickly estimate the amount of voltage drop and overshoot and to develop more complete PDN design methodology as improved target impedances. The proposed PDN noise expressions are also validated with SPICE simulation and measurements using a fabricated IC and PCB.
URI
https://scholarworks.unist.ac.kr/handle/201301/9785
DOI
10.1109/TEMC.2014.2315837
ISSN
0018-9375
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EE_Journal Papers
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