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김진국

Kim, Jingook
Integrated Circuit and Electromagnetic Compatibility Lab.
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dc.citation.endPage 1597 -
dc.citation.number 6 -
dc.citation.startPage 1585 -
dc.citation.title IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY -
dc.citation.volume 56 -
dc.contributor.author Kim, Jingook -
dc.contributor.author Lee, Jongjoo -
dc.contributor.author Ahn, Seungyoung -
dc.contributor.author Fan, Jun -
dc.date.accessioned 2023-12-22T01:48:51Z -
dc.date.available 2023-12-22T01:48:51Z -
dc.date.created 2015-01-02 -
dc.date.issued 2014-12 -
dc.description.abstract A burst stimulus of data is a common activity in circuits and systems. The supply noise voltage waveform induced by a burst train of integrated circuit (IC) switching currents is rigorously derived for a power distribution network (PDN) with power traces, commonly used in handheld devices. Closed-form expressions are proposed to quickly estimate the amount of voltage drop and overshoot and to develop more complete PDN design methodology as improved target impedances. The proposed PDN noise expressions are also validated with SPICE simulation and measurements using a fabricated IC and PCB. -
dc.identifier.bibliographicCitation IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, v.56, no.6, pp.1585 - 1597 -
dc.identifier.doi 10.1109/TEMC.2014.2315837 -
dc.identifier.issn 0018-9375 -
dc.identifier.scopusid 2-s2.0-84919881300 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/9785 -
dc.identifier.wosid 000346716800040 -
dc.language 영어 -
dc.publisher IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC -
dc.title Closed-Form Expressions for the Noise Voltage Caused by a Burst Train of IC Switching Currents on a Power Distribution Network -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.relation.journalWebOfScienceCategory Engineering, Electrical & Electronic; Telecommunications -
dc.relation.journalResearchArea Engineering; Telecommunications -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -

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