Physica Status Solidi (C) Current Topics in Solid State Physics, v.1, no.10, pp.2462 - 2465
Abstract
20 nm GaNAs epilayers were grown on GaN/sapphire by metalorganic chemical vapor deposition. As growth temperature decreased from 720 to 565°C, it was found that As concentration was increased from 1.3 × 1020 and saturated at about 5-6 × 1020 cm-3. GaAs-like GaNAs islands were formed on GaN at 530°C. In case of GaNAs epilayers grown at 565 and 600°C, GaN-like GaNAs phases were observed by high-resolution X-ray diffraction (XRD) and low angle XRD. By low angle XRD and high-resolution TEM with electron nano-beam diffraction patterns, the FCC-stacked region in wurtzite matrix was clearly observed in thin GaNAs layers. We propose that this structural nonuniformity in GaNAs might be caused by the nonuniform distribution of As concentration.