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- Kim, Kyung Rok
- Nano-Electronic Emerging Devices Lab.
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Process Variation Tolerant 28-nm Ternary CMOS Technology with Gate-Inderlap Enginnering
- Author(s)
- Lee, Kwan Yong, Kim, Woo-Seok, Yeo, Sang Hun, Jang, In Jun, Choi, Young-Eun, Kimm, Myoung, Jeong, Yesong, Park, Jun Young, 류민우, Kim, Kyung Rok
- Issued Date
- 2025-02-14
- Citation
- 제32회 한국반도체학술대회
- Publisher
- 한국반도체협회
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