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- Jeong, Changwook
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Realistic and Scalable TCAD for Yield-Aware Full-Chip DTCO
- Author(s)
- Park, Min Chul, Chae, Usuk, Kim, Sangyeon, Kim, Yeji, Kwon, Segab, Lee, Sungyeop, Lee, Ji-Hye, Shin, Byungchul, Jang, Hyunjae, Kim, Namjae, Kim, SeongRyeol, Park, Hong-Hyun, Kim, Jaehwan, Kang, Jae-Hyun, Kim, Yoon-Suk, Kim, Young-Gu, Jeong, Changwook, Jeon, Joong-Won, Kim, Dae Sin
- Issued Date
- 2025-06-10
- Citation
- IEEE Symposium on VLSI Technology
- Publisher
- IEEE
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