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정창욱

Jeong, Changwook
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dc.citation.conferencePlace JA -
dc.citation.title IEEE Symposium on VLSI Technology -
dc.contributor.author Park, Min Chul -
dc.contributor.author Chae, Usuk -
dc.contributor.author Kim, Sangyeon -
dc.contributor.author Kim, Yeji -
dc.contributor.author Kwon, Segab -
dc.contributor.author Lee, Sungyeop -
dc.contributor.author Lee, Ji-Hye -
dc.contributor.author Shin, Byungchul -
dc.contributor.author Jang, Hyunjae -
dc.contributor.author Kim, Namjae -
dc.contributor.author Kim, SeongRyeol -
dc.contributor.author Park, Hong-Hyun -
dc.contributor.author Kim, Jaehwan -
dc.contributor.author Kang, Jae-Hyun -
dc.contributor.author Kim, Yoon-Suk -
dc.contributor.author Kim, Young-Gu -
dc.contributor.author Jeong, Changwook -
dc.contributor.author Jeon, Joong-Won -
dc.contributor.author Kim, Dae Sin -
dc.date.accessioned 2026-01-06T18:59:41Z -
dc.date.available 2026-01-06T18:59:41Z -
dc.date.created 2026-01-06 -
dc.date.issued 2025-06-10 -
dc.identifier.bibliographicCitation IEEE Symposium on VLSI Technology -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/89865 -
dc.publisher IEEE -
dc.title Realistic and Scalable TCAD for Yield-Aware Full-Chip DTCO -
dc.type Conference Paper -
dc.date.conferenceDate 2025-06-08 -

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