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- Shin, Hyung-Joon
- Nanoscale Materials Science Lab.
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Quantitative analysis of Threshold Fields for Ion Extraction
- Author(s)
- Yoo, Dongyeoop, Kim, Yohan, Shin, Hyung-Joon
- Issued Date
- 2025-08-28
- Citation
- The 6th International Workshop on Scanning Probe Microscopy
- Publisher
- The Korean Research Society of Scanning Probe Microscopy
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