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- Shin, Hyung-Joon
- Nanoscale Materials Science Lab.
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | KO | - |
| dc.citation.conferencePlace | 대전 | - |
| dc.citation.title | The 6th International Workshop on Scanning Probe Microscopy | - |
| dc.contributor.author | Yoo, Dongyeoop | - |
| dc.contributor.author | Kim, Yohan | - |
| dc.contributor.author | Shin, Hyung-Joon | - |
| dc.date.accessioned | 2025-12-31T12:52:19Z | - |
| dc.date.available | 2025-12-31T12:52:19Z | - |
| dc.date.created | 2025-12-26 | - |
| dc.date.issued | 2025-08-28 | - |
| dc.identifier.bibliographicCitation | The 6th International Workshop on Scanning Probe Microscopy | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/89571 | - |
| dc.language | 영어 | - |
| dc.publisher | The Korean Research Society of Scanning Probe Microscopy | - |
| dc.title | Quantitative analysis of Threshold Fields for Ion Extraction | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2025-08-27 | - |
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