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- Lee, Zonghoon
- Atomic-Scale Electron Microscopy Lab.
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Progress in 2D Materials Research using Aberration-corrected TEM
- Author(s)
- Lee, Zonghoon
- Issued Date
- 2025-11-26
- Citation
- The 8th International Conference on Advanced Electromaterials (ICAE 2025)
- Publisher
- The Korean Institute of Electrical and Electronic Material Engineers
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