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- Lee, Zonghoon
- Atomic-Scale Electron Microscopy Lab.
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | KO | - |
| dc.citation.title | The 8th International Conference on Advanced Electromaterials (ICAE 2025) | - |
| dc.contributor.author | Lee, Zonghoon | - |
| dc.date.accessioned | 2025-12-19T18:20:50Z | - |
| dc.date.available | 2025-12-19T18:20:50Z | - |
| dc.date.created | 2025-12-18 | - |
| dc.date.issued | 2025-11-26 | - |
| dc.identifier.bibliographicCitation | The 8th International Conference on Advanced Electromaterials (ICAE 2025) | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/89228 | - |
| dc.publisher | The Korean Institute of Electrical and Electronic Material Engineers | - |
| dc.title | Progress in 2D Materials Research using Aberration-corrected TEM | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2025-11-25 | - |
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