File Download
There are no files associated with this item.
SFX Link
- Find it @ UNIST can give you direct access to the published full text of this article. (UNISTARs only)
- Lee, Zonghoon
- Atomic-Scale Electron Microscopy Lab.
Views & Downloads
Detailed Information
Cited time in 
Cited time in 
Cited time in
Metadata Downloads
In Situ TEM Observation of Crack Deflection and Arrest in Graphene-Based Nanocomposite
- Author(s)
- Kim, Kangsik, Yoon, Jongchan, Jang, Younggeun, Choi, Jonghoon, Kim, Seojin, Lee, Zonghoon
- Issued Date
- 2025-07-30
- Citation
- Microscopy & Microanalysis 2025
- Publisher
- Microscopy Society of America
Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.