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- Lee, Zonghoon
- Atomic-Scale Electron Microscopy Lab.
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | US | - |
| dc.citation.title | Microscopy & Microanalysis 2025 | - |
| dc.contributor.author | Kim, Kangsik | - |
| dc.contributor.author | Yoon, Jongchan | - |
| dc.contributor.author | Jang, Younggeun | - |
| dc.contributor.author | Choi, Jonghoon | - |
| dc.contributor.author | Kim, Seojin | - |
| dc.contributor.author | Lee, Zonghoon | - |
| dc.date.accessioned | 2025-12-16T19:11:12Z | - |
| dc.date.available | 2025-12-16T19:11:12Z | - |
| dc.date.created | 2025-12-16 | - |
| dc.date.issued | 2025-07-30 | - |
| dc.identifier.bibliographicCitation | Microscopy & Microanalysis 2025 | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/89157 | - |
| dc.publisher | Microscopy Society of America | - |
| dc.title | In Situ TEM Observation of Crack Deflection and Arrest in Graphene-Based Nanocomposite | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2025-07-27 | - |
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