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- Yoon, Tae-Sik
- Nano Semiconductor Research Lab.
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Retention 개선을 위한 원자층 증착 HfO2 나노결정 차지트랩 플래시 메모리 소자 연구
- Author(s)
- Noh, Taeyun, Yoon, Tae-Sik
- Issued Date
- 2025-06-19
- Citation
- 2025 한국전기전자재료학회 하계학술대회
- Publisher
- 한국전기전자재료학회
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