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- Woo, Kyung Seok
- Emerging Semiconductor Technology Laboratory
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A Combination of a Volatile-Memristor-Based True Random-Number Generator and a Nonlinear-Feedback Shift Register for High-Speed Encryption
- Author(s)
- Woo, Kyung Seok, Wang, Yongmin, Kim, Yumin, Kim, Jihun, Kim, Woohyun, Hwang, Cheol Seong
- Issued Date
- 2020-05
- Citation
- ADVANCED ELECTRONIC MATERIALS, v.6, no.5, pp.1901117
- Abstract
- A true random-number generator (TRNG) and a nonlinear feedback shift register (NFSR) are combined to create a new type of TRNG. This TRNG is based on the intrinsic stochasticity of threshold switching behavior in a Pt/HfO2/TiN memristor and an NFSR circuit. Considering the transition rate of the hopping process, the stochasticity of the delay time can be attributed to the phonon-assisted hopping process. This novel TRNG passes all 15 National Institute of Standards and Technology randomness tests without post-processing steps, proving its performance as a hardware security application. By combining the TRNG with the NFSR, the bit generation rate is further improved, allowing it to be used for high-speed applications.
- Publisher
- WILEY
- ISSN
- 2199-160X
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