File Download
There are no files associated with this item.
SFX Link
- Find it @ UNIST can give you direct access to the published full text of this article. (UNISTARs only)
- Kim, Junghwan
Views & Downloads
Detailed Information
Cited time in 
Cited time in 
Cited time in
Metadata Downloads
Analysis of Defect / Interface States for Oxide TFTs utilizing HAX-PES
- Author(s)
- Kim, Junghwan, Zhang, Xuejian, Sim, Kihyung, Park, Hyunwoo, Chung, Kwunbum, Hosono, Hideo
- Issued Date
- 2023-08-25
- Fulltext
- https://imid.or.kr/2023/invited.asp
- Citation
- The 23rd International Meeting on Information Display (IMID2023)
- Publisher
- 한국정보디스플레이학회
Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.