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- Kim, Junghwan
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | KO | - |
| dc.citation.title | The 23rd International Meeting on Information Display (IMID2023) | - |
| dc.contributor.author | Kim, Junghwan | - |
| dc.contributor.author | Zhang, Xuejian | - |
| dc.contributor.author | Sim, Kihyung | - |
| dc.contributor.author | Park, Hyunwoo | - |
| dc.contributor.author | Chung, Kwunbum | - |
| dc.contributor.author | Hosono, Hideo | - |
| dc.date.accessioned | 2025-08-01T09:00:02Z | - |
| dc.date.available | 2025-08-01T09:00:02Z | - |
| dc.date.created | 2025-07-30 | - |
| dc.date.issued | 2023-08-25 | - |
| dc.identifier.bibliographicCitation | The 23rd International Meeting on Information Display (IMID2023) | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/87595 | - |
| dc.identifier.url | https://imid.or.kr/2023/invited.asp | - |
| dc.language | 영어 | - |
| dc.publisher | 한국정보디스플레이학회 | - |
| dc.title | Analysis of Defect / Interface States for Oxide TFTs utilizing HAX-PES | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2023-08-22 | - |
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