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CrossRIV-AI AND ARECo-SAMPLING: AN INTEGRATED AI FRAMEWORK FOR EFFICIENT DATA LABELING AND CONTINUOUS AI OPTIMIZATION IN MANUFACTURING INSPECTION SYSTEMS
- Author(s)
- Kim, Minjoon
- Advisor
- Kim, Namhun
- Issued Date
- 2025-02
- URI
- https://scholarworks.unist.ac.kr/handle/201301/86381 http://unist.dcollection.net/common/orgView/200000861824
- Publisher
- Ulsan National Institute of Science and Technology
- Degree
- Doctor
- Major
- Graduate School of Artificial Intelligence
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