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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.advisor | Kim, Namhun | - |
| dc.contributor.author | Kim, Minjoon | - |
| dc.date.accessioned | 2025-04-04T13:48:18Z | - |
| dc.date.available | 2025-04-04T13:48:18Z | - |
| dc.date.issued | 2025-02 | - |
| dc.description.degree | Doctor | - |
| dc.description | Graduate School of Artificial Intelligence | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/86381 | - |
| dc.identifier.uri | http://unist.dcollection.net/common/orgView/200000861824 | - |
| dc.language | ENG | - |
| dc.publisher | Ulsan National Institute of Science and Technology | - |
| dc.rights.embargoReleaseDate | 9999-12-31 | - |
| dc.rights.embargoReleaseTerms | 9999-12-31 | - |
| dc.subject | Self-supervised Learning | - |
| dc.subject | Contrastive Learning | - |
| dc.subject | Active Learning | - |
| dc.subject | Uncertainty Sampling | - |
| dc.subject | Manufacturing Quality Control | - |
| dc.subject | Manufacturing Inspection System | - |
| dc.subject | Paint Defect Detection | - |
| dc.title | CrossRIV-AI AND ARECo-SAMPLING: AN INTEGRATED AI FRAMEWORK FOR EFFICIENT DATA LABELING AND CONTINUOUS AI OPTIMIZATION IN MANUFACTURING INSPECTION SYSTEMS | - |
| dc.type | Thesis | - |
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