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- Lee, Kyuho Jason
- Intelligent Systems Lab.
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A 28-nm 323 TOPS/mm2/B and 2007 TOPS/W/B Ternary Latch Based Sparsity-Aware CIM Macro with Double-Sampling Ternary ADC
- Author(s)
- Kim, Myoung, Jeong, Hoichang, Kim, Woo-Seok, Jeong, Yesong, Choi, Young-Eun, Park, Junyoung, Ryu, Min Woo, Lee, Yong Kyu, Lee, Kyuho Jason, Kim, Kyung Rok
- Issued Date
- 2024-11-19
- Citation
- IEEE Asian Solid-State Circuits Conference 2024
- Publisher
- IEEE
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