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- Lee, Kyuho Jason
- Intelligent Systems Lab.
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | JA | - |
| dc.citation.title | IEEE Asian Solid-State Circuits Conference 2024 | - |
| dc.contributor.author | Kim, Myoung | - |
| dc.contributor.author | Jeong, Hoichang | - |
| dc.contributor.author | Kim, Woo-Seok | - |
| dc.contributor.author | Jeong, Yesong | - |
| dc.contributor.author | Choi, Young-Eun | - |
| dc.contributor.author | Park, Junyoung | - |
| dc.contributor.author | Ryu, Min Woo | - |
| dc.contributor.author | Lee, Yong Kyu | - |
| dc.contributor.author | Lee, Kyuho Jason | - |
| dc.contributor.author | Kim, Kyung Rok | - |
| dc.date.accessioned | 2025-01-06T16:05:07Z | - |
| dc.date.available | 2025-01-06T16:05:07Z | - |
| dc.date.created | 2025-01-06 | - |
| dc.date.issued | 2024-11-19 | - |
| dc.identifier.bibliographicCitation | IEEE Asian Solid-State Circuits Conference 2024 | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/85744 | - |
| dc.publisher | IEEE | - |
| dc.title | A 28-nm 323 TOPS/mm2/B and 2007 TOPS/W/B Ternary Latch Based Sparsity-Aware CIM Macro with Double-Sampling Ternary ADC | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2024-11-18 | - |
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