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- Park, Heechun
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Fault Coverage and Resource Analysis for Diverse Structures of Clock TSV Fault-Tolerant Units in 3D ICs
- Author(s)
- Park, Heechun, Kim, Taewhan
- Issued Date
- 2013-11-17
- Citation
- 2013 International SoC Design Conference (ISOCC)
- Publisher
- IEEE
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