File Download

There are no files associated with this item.

  • Find it @ UNIST can give you direct access to the published full text of this article. (UNISTARs only)
Related Researcher

권오훈

Kwon, Oh Hoon
Ultrafast Laser Spectroscopy and Nano-microscopy Lab.
Read More

Views & Downloads

Detailed Information

Cited time in webofscience Cited time in scopus
Metadata Downloads

High-Resolution Correlative Imaging in Ultrafast Electron Microscopy

Author(s)
Kim, Ye JinPark, Won WooNoh, Hak WonKwon, Oh Hoon
Issued Date
2024-02
DOI
10.1080/23746149.2024.2316710
URI
https://scholarworks.unist.ac.kr/handle/201301/81353
Citation
ADVANCES IN PHYSICS-X, v.9, no.1, pp.2316710
Abstract
Ultrafast electron microscopy (UEM) has a broad scope of application across material systems and scientific disciplines. In UEM, we investigate multiscale dynamics in the spatial domain ranging from micrometres to ångströms, in reciprocal space, and on timescales from microseconds to attoseconds, with an energy resolution of a few electronvolts or less. Notably, UEM has played a pivotal role in visualisation of ultrafast structural dynamics with high local selectivity, enabling the exploration of the dynamic nature of chemical bonding in non-equilibrium states and investigation of electron–photon interactions to manipulate free-electron wavefunctions. This breakthrough has created new opportunities in condensed matter physics, chemical dynamics, and quantum electrodynamics. In addition, efforts are underway to achieve high-resolution UEM in correlative real-space microscopy to diffractography and spectroscopy in a single instrument for comprehensive investigations of light–matter interactions and structure–dynamics–function relations. In this review, we provide an overview of the current state of UEM imaging capabilities and scientific interests, outlining the technological challenges faced by UEM in related fields and exploring potential approaches to overcome these challenges. Furthermore, we highlight the emerging fields of interest and present future perspectives that can further extend the imaging capabilities of UEM.
Publisher
TAYLOR & FRANCIS LTD
ISSN
2374-6149
Keyword (Author)
Correlative imagingelectron diffraction and spectroscopyphotoelectron pulsetime-resolved real-space imagingultrafast electron microscopy (UEM)
Keyword
ENERGY-LOSS SPECTROSCOPYX-RAYVIBRATIONAL SPECTROSCOPYTEMPORAL RESOLUTIONCARRIER DYNAMICS

qrcode

Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.