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권오훈

Kwon, Oh Hoon
Ultrafast Laser Spectroscopy and Nano-microscopy Lab.
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dc.citation.number 1 -
dc.citation.startPage 2316710 -
dc.citation.title ADVANCES IN PHYSICS-X -
dc.citation.volume 9 -
dc.contributor.author Kim, Ye Jin -
dc.contributor.author Park, Won Woo -
dc.contributor.author Noh, Hak Won -
dc.contributor.author Kwon, Oh Hoon -
dc.date.accessioned 2024-02-14T13:35:09Z -
dc.date.available 2024-02-14T13:35:09Z -
dc.date.created 2024-02-14 -
dc.date.issued 2024-02 -
dc.description.abstract Ultrafast electron microscopy (UEM) has a broad scope of application across material systems and scientific disciplines. In UEM, we investigate multiscale dynamics in the spatial domain ranging from micrometres to ångströms, in reciprocal space, and on timescales from microseconds to attoseconds, with an energy resolution of a few electronvolts or less. Notably, UEM has played a pivotal role in visualisation of ultrafast structural dynamics with high local selectivity, enabling the exploration of the dynamic nature of chemical bonding in non-equilibrium states and investigation of electron–photon interactions to manipulate free-electron wavefunctions. This breakthrough has created new opportunities in condensed matter physics, chemical dynamics, and quantum electrodynamics. In addition, efforts are underway to achieve high-resolution UEM in correlative real-space microscopy to diffractography and spectroscopy in a single instrument for comprehensive investigations of light–matter interactions and structure–dynamics–function relations. In this review, we provide an overview of the current state of UEM imaging capabilities and scientific interests, outlining the technological challenges faced by UEM in related fields and exploring potential approaches to overcome these challenges. Furthermore, we highlight the emerging fields of interest and present future perspectives that can further extend the imaging capabilities of UEM. -
dc.identifier.bibliographicCitation ADVANCES IN PHYSICS-X, v.9, no.1, pp.2316710 -
dc.identifier.doi 10.1080/23746149.2024.2316710 -
dc.identifier.issn 2374-6149 -
dc.identifier.scopusid 2-s2.0-85185319637 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/81353 -
dc.identifier.wosid 001166774300001 -
dc.language 영어 -
dc.publisher TAYLOR & FRANCIS LTD -
dc.title High-Resolution Correlative Imaging in Ultrafast Electron Microscopy -
dc.type Article -
dc.description.isOpenAccess TRUE -
dc.relation.journalWebOfScienceCategory Physics, Multidisciplinary -
dc.relation.journalResearchArea Physics -
dc.type.docType Review -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordAuthor Correlative imaging -
dc.subject.keywordAuthor electron diffraction and spectroscopy -
dc.subject.keywordAuthor photoelectron pulse -
dc.subject.keywordAuthor time-resolved real-space imaging -
dc.subject.keywordAuthor ultrafast electron microscopy (UEM) -
dc.subject.keywordPlus ENERGY-LOSS SPECTROSCOPY -
dc.subject.keywordPlus X-RAY -
dc.subject.keywordPlus VIBRATIONAL SPECTROSCOPY -
dc.subject.keywordPlus TEMPORAL RESOLUTION -
dc.subject.keywordPlus CARRIER DYNAMICS -

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