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- Kim, Jingook
- Integrated Circuit and Electromagnetic Compatibility Lab.
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | US | - |
| dc.citation.conferencePlace | Peppermill Resort and CasinoReno | - |
| dc.citation.title | 40th Annual Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2018 | - |
| dc.contributor.author | Jeong, Myeongjo | - |
| dc.contributor.author | Park, Junsik | - |
| dc.contributor.author | Kim, Jinwoo | - |
| dc.contributor.author | Seung, Manho | - |
| dc.contributor.author | Lee, Seokkiu | - |
| dc.contributor.author | Kim, Jingook | - |
| dc.date.accessioned | 2024-02-01T01:36:03Z | - |
| dc.date.available | 2024-02-01T01:36:03Z | - |
| dc.date.created | 2018-12-20 | - |
| dc.date.issued | 2018-09-23 | - |
| dc.description.abstract | A sense amplifier flip-flop, which is commonly used as an input receiver in a DRAM, is designed in the simplified motherboard and DIMM structures of a laptop PC. System-level ESD-induced soft failures of the sense amplifier flip-flop are measured and validated with SPICE simulation. | - |
| dc.identifier.bibliographicCitation | 40th Annual Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2018 | - |
| dc.identifier.doi | 10.23919/EOS/ESD.2018.8509690 | - |
| dc.identifier.isbn | 1585373028 | - |
| dc.identifier.issn | 0739-5159 | - |
| dc.identifier.scopusid | 2-s2.0-85056853490 | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/80886 | - |
| dc.identifier.url | https://ieeexplore.ieee.org/document/8509690 | - |
| dc.language | 영어 | - |
| dc.publisher | 40th Annual Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2018 | - |
| dc.title | Measurement and analysis of system-level ESD-indauced soft failures of a sense amplifier flip-flop with pseudo differential inputs | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2018-09-23 | - |
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