We demonstrate a record-high performance monolithic trantenna (transistor-antenna) using 65-nm CMOS foundry in the field of a plasmonic terahertz (THz) detector. By applying ultimate structural asymmetry between source and drain on a ring FET with source diameter (dS) scaling from 30 to 0.38 mm, we obtained 180 times more enhanced photoresponse (Du) in on-chip THz measurement. Through free-space THz imaging experiments, the conductive drain region of ring FET itself showed a frequency sensitivity with resonance frequency at 0.12 THz in 0.09~ 0.2 THz range and polarization-independent imaging results as an isotropic circular antenna. Highlyscalable and feeding line-free monolithic trantenna enables a high-performance THz detector with responsivity of 8.8 kV/W and NEP of 3.36 pW/Hz0.5 at the target frequency.