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- Lee, Sukbin
- Multidimensional Structural Materials Lab.
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Three-dimensional characterization of microstructure by electron back-scatter diffraction
- Author(s)
- Rollett, Anthony D., Lee, Sukbin, Campman, R., Rohrer, G. S.
- Issued Date
- 2007
- Citation
- ANNUAL REVIEW OF MATERIALS RESEARCH, v.37, pp.627 - 658
- Abstract
- The characterization of microstructures in three dimensions is reviewed, with an emphasis on the use of automated electron back-scatter diffraction techniques. Both statistical reconstruction of polycrystalline structures from multiple cross sections and reconstruction from parallel, serial sections are discussed. In addition, statistical reconstruction of second-phase particle microstructures from multiple cross sections is reviewed.
- Publisher
- ANNUAL REVIEWS
- ISSN
- 1531-7331
- Keyword (Author)
- orientation scanning, statistical reconstruction, microscopy texture, EBSD
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