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Lee, Sukbin
Multidimensional Structural Materials Lab
Research Interests
  • Microstructural evolution, advanced characterization, computational materials science, 3D materials science, microstructure-property relation

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Three-dimensional characterization of microstructure by electron back-scatter diffraction

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Title
Three-dimensional characterization of microstructure by electron back-scatter diffraction
Author
Rollett, Anthony D.Lee, SukbinCampman, R.Rohrer, G. S.
Issue Date
2007
Publisher
ANNUAL REVIEWS
Citation
ANNUAL REVIEW OF MATERIALS RESEARCH, v.37, pp.627 - 658
Abstract
The characterization of microstructures in three dimensions is reviewed, with an emphasis on the use of automated electron back-scatter diffraction techniques. Both statistical reconstruction of polycrystalline structures from multiple cross sections and reconstruction from parallel, serial sections are discussed. In addition, statistical reconstruction of second-phase particle microstructures from multiple cross sections is reviewed.
URI
https://scholarworks.unist.ac.kr/handle/201301/7895
URL
http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=34848832043
DOI
10.1146/annurev.matsci.37.052506.084401
ISSN
1531-7331
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MSE_Journal Papers
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