File Download

There are no files associated with this item.

  • Find it @ UNIST can give you direct access to the published full text of this article. (UNISTARs only)
Related Researcher

이석빈

Lee, Sukbin
Multidimensional Structural Materials Lab.
Read More

Views & Downloads

Detailed Information

Cited time in webofscience Cited time in scopus
Metadata Downloads

Full metadata record

DC Field Value Language
dc.citation.endPage 658 -
dc.citation.startPage 627 -
dc.citation.title ANNUAL REVIEW OF MATERIALS RESEARCH -
dc.citation.volume 37 -
dc.contributor.author Rollett, Anthony D. -
dc.contributor.author Lee, Sukbin -
dc.contributor.author Campman, R. -
dc.contributor.author Rohrer, G. S. -
dc.date.accessioned 2023-12-22T09:38:03Z -
dc.date.available 2023-12-22T09:38:03Z -
dc.date.created 2014-10-27 -
dc.date.issued 2007 -
dc.description.abstract The characterization of microstructures in three dimensions is reviewed, with an emphasis on the use of automated electron back-scatter diffraction techniques. Both statistical reconstruction of polycrystalline structures from multiple cross sections and reconstruction from parallel, serial sections are discussed. In addition, statistical reconstruction of second-phase particle microstructures from multiple cross sections is reviewed. -
dc.identifier.bibliographicCitation ANNUAL REVIEW OF MATERIALS RESEARCH, v.37, pp.627 - 658 -
dc.identifier.doi 10.1146/annurev.matsci.37.052506.084401 -
dc.identifier.issn 1531-7331 -
dc.identifier.scopusid 2-s2.0-34848832043 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/7895 -
dc.identifier.url http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=34848832043 -
dc.identifier.wosid 000248758300020 -
dc.language 영어 -
dc.publisher ANNUAL REVIEWS -
dc.title Three-dimensional characterization of microstructure by electron back-scatter diffraction -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordAuthor orientation scanning -
dc.subject.keywordAuthor statistical reconstruction -
dc.subject.keywordAuthor microscopy texture -
dc.subject.keywordAuthor EBSD -
dc.subject.keywordPlus SPATIAL CORRELATION-FUNCTIONS -
dc.subject.keywordPlus PHASE SINTERED MATERIALS -
dc.subject.keywordPlus NORMALGRAIN-GROWTH -
dc.subject.keywordPlus HETEROGENEOUS MATERIALS -
dc.subject.keywordPlus PREDICTING PROPERTIES -
dc.subject.keywordPlus STOCHASTICRECONSTRUCTION -
dc.subject.keywordPlus 2-PHASE SOLIDS -
dc.subject.keywordPlus NUMERICAL-SIMULATION -
dc.subject.keywordPlus 3DMICROSTRUCTURES -
dc.subject.keywordPlus SIZE DISTRIBUTION -

qrcode

Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.