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Lee, Sukbin
Multidimensional Structural Materials Lab
Research Interests
  • Microstructural evolution, advanced characterization, computational materials science, 3D materials science, microstructure-property relation


Three-dimensional characterization of microstructure by electron back-scatter diffraction

DC Field Value Language Rollett, Anthony D. ko Lee, Sukbin ko Campman, R. ko Rohrer, G. S. ko 2014-10-29T00:20:49Z - 2014-10-27 ko 2007 ko
dc.identifier.citation ANNUAL REVIEW OF MATERIALS RESEARCH, v.37, pp.627 - 658 ko
dc.identifier.issn 1531-7331 ko
dc.identifier.uri -
dc.description.abstract The characterization of microstructures in three dimensions is reviewed, with an emphasis on the use of automated electron back-scatter diffraction techniques. Both statistical reconstruction of polycrystalline structures from multiple cross sections and reconstruction from parallel, serial sections are discussed. In addition, statistical reconstruction of second-phase particle microstructures from multiple cross sections is reviewed. ko
dc.description.statementofresponsibility close -
dc.language 영어 ko
dc.publisher ANNUAL REVIEWS ko
dc.title Three-dimensional characterization of microstructure by electron back-scatter diffraction ko
dc.type ARTICLE ko
dc.identifier.scopusid 2-s2.0-34848832043 ko
dc.identifier.wosid 000248758300020 ko
dc.type.rims ART ko
dc.description.wostc 61 *
dc.description.scopustc 66 * 2015-05-06 * 2014-10-27 *
dc.identifier.doi 10.1146/annurev.matsci.37.052506.084401 ko
dc.identifier.url ko
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