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Lee, Sukbin
Multidimensional Structural Materials Lab
Research Interests
  • Microstructural evolution, advanced characterization, computational materials science, 3D materials science, microstructure-property relation

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Three-dimensional characterization of microstructure by electron back-scatter diffraction

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dc.contributor.author Rollett, Anthony D. ko
dc.contributor.author Lee, Sukbin ko
dc.contributor.author Campman, R. ko
dc.contributor.author Rohrer, G. S. ko
dc.date.available 2014-10-29T00:20:49Z -
dc.date.created 2014-10-27 ko
dc.date.issued 2007 ko
dc.identifier.citation ANNUAL REVIEW OF MATERIALS RESEARCH, v.37, pp.627 - 658 ko
dc.identifier.issn 1531-7331 ko
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/7895 -
dc.description.abstract The characterization of microstructures in three dimensions is reviewed, with an emphasis on the use of automated electron back-scatter diffraction techniques. Both statistical reconstruction of polycrystalline structures from multiple cross sections and reconstruction from parallel, serial sections are discussed. In addition, statistical reconstruction of second-phase particle microstructures from multiple cross sections is reviewed. ko
dc.description.statementofresponsibility close -
dc.language 영어 ko
dc.publisher ANNUAL REVIEWS ko
dc.title Three-dimensional characterization of microstructure by electron back-scatter diffraction ko
dc.type ARTICLE ko
dc.identifier.scopusid 2-s2.0-34848832043 ko
dc.identifier.wosid 000248758300020 ko
dc.type.rims ART ko
dc.description.wostc 61 *
dc.description.scopustc 66 *
dc.date.tcdate 2015-05-06 *
dc.date.scptcdate 2014-10-27 *
dc.identifier.doi 10.1146/annurev.matsci.37.052506.084401 ko
dc.identifier.url http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=34848832043 ko
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