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Shin, Heungjoo
Micro/Nano Integrated Systems (MNIS) Lab
Research Interests
  • Carbon-MEMS
  • Nanofabrication
  • Gas sensors
  • Biosensors
  • Electrochemical sensors
  • SPM

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Alternating current (AC) impedance imaging with combined atomic force scanning electrochemical microscopy (AFM-SECM)

Cited 18 times inthomson ciCited 14 times inthomson ci
Title
Alternating current (AC) impedance imaging with combined atomic force scanning electrochemical microscopy (AFM-SECM)
Author
Eckhard, K.Shin, HeungjooMizaikoff, B.Schuhmann, W.Kranz, C.
Keywords
AC-SECM; AFM-SECM; Integrated electrodes; Localized impedance
Issue Date
2007-06
Publisher
ELSEVIER SCIENCE INC
Citation
ELECTROCHEMISTRY COMMUNICATIONS, v.9, no.6, pp.1311 - 1315
Abstract
AFM-SECM measurements using alternating current mode SECM (AC-SECM) were performed at an AFM tip with an integrated recessed ring microelectrode. Measurements were carried out in a three-electrode arrangement at 14.92 kHz and 110 mVpp in 1 mM KCl solution. Combined AFM-AC-SECM enables the detection of electrochemical surface properties with high lateral resolution without addition of a redox mediator, thereby providing images on topographical changes along with chemical information. For demonstrating the capabilities of this method, simultaneously recorded data on the topography and the surface conductivity of gold/glass structures and of microelectrode arrays are discussed.
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DOI
10.1016/j.elecom.2007.01.027
ISSN
1388-2481
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