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Shin, Heungjoo
Micro/Nano Integrated Systems (MNIS) Lab
Research Interests
  • Carbon-MEMS
  • Nanofabrication
  • Gas sensors
  • Biosensors
  • Electrochemical sensors
  • SPM

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Alternating current (AC) impedance imaging with combined atomic force scanning electrochemical microscopy (AFM-SECM)

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dc.contributor.author Eckhard, K. ko
dc.contributor.author Shin, Heungjoo ko
dc.contributor.author Mizaikoff, B. ko
dc.contributor.author Schuhmann, W. ko
dc.contributor.author Kranz, C. ko
dc.date.available 2014-10-16T01:54:32Z -
dc.date.created 2014-10-15 ko
dc.date.issued 2007-06 -
dc.identifier.citation ELECTROCHEMISTRY COMMUNICATIONS, v.9, no.6, pp.1311 - 1315 ko
dc.identifier.issn 1388-2481 ko
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/7257 -
dc.identifier.uri http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=34248669318 ko
dc.description.abstract AFM-SECM measurements using alternating current mode SECM (AC-SECM) were performed at an AFM tip with an integrated recessed ring microelectrode. Measurements were carried out in a three-electrode arrangement at 14.92 kHz and 110 mVpp in 1 mM KCl solution. Combined AFM-AC-SECM enables the detection of electrochemical surface properties with high lateral resolution without addition of a redox mediator, thereby providing images on topographical changes along with chemical information. For demonstrating the capabilities of this method, simultaneously recorded data on the topography and the surface conductivity of gold/glass structures and of microelectrode arrays are discussed. ko
dc.description.statementofresponsibility close -
dc.language ENG ko
dc.publisher ELSEVIER SCIENCE INC ko
dc.subject AC-SECM ko
dc.subject AFM-SECM ko
dc.subject Integrated electrodes ko
dc.subject Localized impedance ko
dc.title Alternating current (AC) impedance imaging with combined atomic force scanning electrochemical microscopy (AFM-SECM) ko
dc.type ARTICLE ko
dc.identifier.scopusid 2-s2.0-34248669318 ko
dc.identifier.wosid 000247803000014 ko
dc.type.rims ART ko
dc.description.wostc 18 *
dc.description.scopustc 14 *
dc.date.tcdate 2015-05-06 *
dc.date.scptcdate 2014-10-15 *
dc.identifier.doi 10.1016/j.elecom.2007.01.027 ko
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